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Surface and Interface Analysis : SIA

Analytics: Show analyticsPublisher: New York : John Wiley & Sons Limited, 1996-ISSN: 0142-2421 (ed. impresa); 1096-9918 (ed. electrónica).Uniform titles: Wiley Online Library e-journalsSubject: Química -- Publicaciones periódicas | Física -- Publicaciones periódicasOnline resources: Acceso a este recurso digital (usuarios Universidad Europea de Madrid)Digital Resources Abstract: Publishes papers on the development and application of characterization techniques for surfaces, interfaces and thin films Includes papers dealing with standardization, quantification, applications to industrial problemsHoldings:
1997-
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Item type Current library Collection Call number Copy number Status Date due Barcode Item holds
REVISTA-E NO PRÉSTAMO REVISTA-E NO PRÉSTAMO Madrid Digital Acceso Electrónico (UEM) Ciencias e Ingeniería QD1 ES (Browse shelf(Opens below)) .i11630280 Acceso electrónico eREVISTA .i11630280
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Publishes papers on the development and application of characterization techniques for surfaces, interfaces and thin films Includes papers dealing with standardization, quantification, applications to industrial problems

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