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IP Cores Design from Specifications to Production : Modeling, Verification, Optimization, and Protection / by Khaled Salah Mohamed

By: Mohamed, Khaled Salah
Contributor(s): SpringerLink (Online service)
Material type: materialTypeLabelE-bookSeries: (Analog Circuits and Signal Processing, 1872-082X).Publisher: Cham : Springer International Publishing, 2016Description: 1 recurso en línea (IX, 154 páginas) : 153 ilustraciones, 115 ilustraciones en color.ISBN: 9783319220352.Subject: Microprocesadores | ElectrónicaDDC classification: 621.3815 Online resources: Acceso a este recurso digital (usuarios Universidad Europea de Madrid)Digital Resources
Contents:
1. Introduction -- 2. IP Cores Design from Specifications to Production: Modeling, Verification, Optimization, and Protection -- 3. Analyzing the Trade-off between Different Memory Cores and Controllers -- 4. SOC BUSES AND PERIPHERALS: FEATURES AND ARCHITECTURES -- 5. Verilog for Implementation and Verification -- 6. New Trends in SoC Verification: UVM, Bug Localization, Scan-Chain-Based Methodology, GA-Based Test Generation -- 7. Conclusions.
Abstract: This book describes the life cycle process of IP cores, from specification to production, including IP modeling, verification, optimization, and protection. Various trade-offs in the design process are discussed, including� those associated with many of the most common memory cores, controller IPs� and system-on-chip (SoC) buses. Readers will also benefit from the author�s practical coverage of new verification methodologies. such as bug localization, UVM, and scan-chain.� A SoC case study is presented to compare traditional verification with the new verification methodologies. ·�������� Discusses the entire life cycle process of IP cores, from specification to production, including IP modeling, verification, optimization, and protection; ·�������� Introduce a deep introduction for Verilog for both implementation and verification point of view.� ·�������� Demonstrates how to use IP in applications such as memory controllers and SoC buses. ·�������� Describes a new verification methodology called bug localization; ·�������� Presents a novel scan-chain methodology for RTL debugging; ·�������� Enables readers to employ UVM methodology in straightforward, practical terms.
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Holdings
Item type Current library Collection Call number Copy number Status Date due Barcode Item holds
LIBRO-E NO PRÉSTAMO LIBRO-E NO PRÉSTAMO Madrid Digital Acceso Electrónico (UEM) Ciencias e Ingeniería TK7874.75 M643 2016 EB (Browse shelf(Opens below)) .i11585286 Acceso electrónico eBOOK .i11585286
Total holds: 0

1. Introduction -- 2. IP Cores Design from Specifications to Production: Modeling, Verification, Optimization, and Protection -- 3. Analyzing the Trade-off between Different Memory Cores and Controllers -- 4. SOC BUSES AND PERIPHERALS: FEATURES AND ARCHITECTURES -- 5. Verilog for Implementation and Verification -- 6. New Trends in SoC Verification: UVM, Bug Localization, Scan-Chain-Based Methodology, GA-Based Test Generation -- 7. Conclusions.

This book describes the life cycle process of IP cores, from specification to production, including IP modeling, verification, optimization, and protection. Various trade-offs in the design process are discussed, including� those associated with many of the most common memory cores, controller IPs� and system-on-chip (SoC) buses. Readers will also benefit from the author�s practical coverage of new verification methodologies. such as bug localization, UVM, and scan-chain.� A SoC case study is presented to compare traditional verification with the new verification methodologies. ·�������� Discusses the entire life cycle process of IP cores, from specification to production, including IP modeling, verification, optimization, and protection; ·�������� Introduce a deep introduction for Verilog for both implementation and verification point of view.� ·�������� Demonstrates how to use IP in applications such as memory controllers and SoC buses. ·�������� Describes a new verification methodology called bug localization; ·�������� Presents a novel scan-chain methodology for RTL debugging; ·�������� Enables readers to employ UVM methodology in straightforward, practical terms.

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