Photon Counting Computed Tomography : Clinical Applications, Image Reconstruction and Material Discrimination / edited by Scott Hsieh, Krzysztof (Kris) Iniewski
Material type:
E-bookPublisher: Cham : Springer International Publishing, 2023Edition: 1st ed. 2023.Description: 1 recurso en línea.ISBN: 9783031260629.Subject: Tomografía
Summary: This book will provide readers with a good overview of some of most recent advances in the field of CT technology for X-ray medical imaging, especially as it pertains to new detectors. There will be a good mixture of general chapters in both technology and applications in medical imaging and industrial testing. The book will have an in-depth review of the research topics from world-leading specialists in the field. The conversion of the X-ray signal into analogue/digital value will be covered in some chapters. The authors also provide a review of CMOS chips for X-ray image sensors. Covers a broad range of topics, including an introduction to novel spectral Computed Tomography; Includes in-depth analysis on how to optimize X-ray detection; Discusses analysis of electronics for X-ray detection.
| Item type | Current library | Collection | Call number | Status | Date due | Barcode | Item holds | |
|---|---|---|---|---|---|---|---|---|
LIBRO-E NO PRÉSTAMO
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Madrid Digital Acceso Electrónico (UEM) | Ciencias de la Salud | RC78.7 .T6 2023 EB (Browse shelf(Opens below)) | Acceso electrónico | ebook28052300 |
This book will provide readers with a good overview of some of most recent advances in the field of CT technology for X-ray medical imaging, especially as it pertains to new detectors. There will be a good mixture of general chapters in both technology and applications in medical imaging and industrial testing. The book will have an in-depth review of the research topics from world-leading specialists in the field. The conversion of the X-ray signal into analogue/digital value will be covered in some chapters. The authors also provide a review of CMOS chips for X-ray image sensors. Covers a broad range of topics, including an introduction to novel spectral Computed Tomography; Includes in-depth analysis on how to optimize X-ray detection; Discusses analysis of electronics for X-ray detection.
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