Image from Google Jackets

Thermal Conductivity Measurements in Atomically Thin Materials and Devices / T Serkan Kasirga

By: Kasirga, T. Serkan, autor
Contributor(s): SpringerLink (Online service)
Material type: materialTypeLabelE-bookSeries: (Nanoscience and Nanotechnology, 2196-1670); (Engineering (Springer-11647)).Publisher: Singapore : Springer Singapore : Imprint: Springer, 2020Edition: First edition.Description: 1 recurso en línea (XV, 50 páginas) : 24 ilustraciones, 21 ilustraciones a color.ISBN: 9789811553486.Subject: Semiconductores -- Propiedades térmicasOnline resources: Acceso a este recurso digital (usuarios Universidad Europea de Madrid)Digital Resources
Contents:
Introduction -- Importance of thermal management in modern applications -- Thermal properties of atomically thin materials and devices -- Thermal conductivity measurement methods for nanosheets -- Steady-state measurement methods -- Transient measurement methods -- Use of photothermal effects as a novel thermal conductivity measurement method -- Outlook.
Abstract: This book assesses the thermal feasibility of using materials with atomically thin layers such as graphene and the transition metal dichalcogenides family in electronics and optoelectronics applications. The focus is on thermal conductivity measurement techniques currently available for the investigation of thermal performance at the material and device level. In addition to providing detailed information on the available techniques, the book introduces readers to novel techniques based on photothermal effects. .
Tags from this library: No tags from this library for this title. Log in to add tags.
Star ratings
    Average rating: 0.0 (0 votes)
Holdings
Item type Current library Collection Call number Status Date due Barcode Item holds
LIBRO-E NO PRÉSTAMO LIBRO-E NO PRÉSTAMO Madrid Digital Acceso Electrónico (UEM) Ciencias e Ingeniería TA418.9.T45 2020 EB (Browse shelf(Opens below)) Acceso electrónico eBook.24062105
Total holds: 0

Introduction -- Importance of thermal management in modern applications -- Thermal properties of atomically thin materials and devices -- Thermal conductivity measurement methods for nanosheets -- Steady-state measurement methods -- Transient measurement methods -- Use of photothermal effects as a novel thermal conductivity measurement method -- Outlook.

This book assesses the thermal feasibility of using materials with atomically thin layers such as graphene and the transition metal dichalcogenides family in electronics and optoelectronics applications. The focus is on thermal conductivity measurement techniques currently available for the investigation of thermal performance at the material and device level. In addition to providing detailed information on the available techniques, the book introduces readers to novel techniques based on photothermal effects. .

There are no comments on this title.

to post a comment.