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On-Chip Current Sensors for Reliable, Secure, and Low-Power Integrated Circuits / by Rodrigo Possamai Bastos, Frank Sill Torres.

By: Bastos, Rodrigo Possamai, autor
Contributor(s): Torres, Frank Sill, autor
Series: (Engineering (Springer-11647)).Publisher: Cham : Springer International Publishing, 2020Edition: 1st ed. 2020.Description: 1 recurso en línea (XXXII, 162 páginas) : 80 ilustraciones, 50 ilustraciones a color.ISBN: 9783030293536.Subject: Circuitos integradosOnline resources: Acceso a este recurso digital (usuarios Universidad Europea de Madrid)Digital Resources
Contents:
Chapter 1. Effects of transient faults in integrated circuits -- Chapter 2. Effectiveness of hardware-level techniques in detecting transient faults -- Chapter 3. Architectures of body built-in current sensors for detection of transient faults -- Chapter 4. Enhancing the design of body built-in sensor architectures -- Chapter 5. Noise robustness of body built-in sensors -- Chapter 6. Body built-in cells for detecting transient faults and adaptively biasing subcircuits -- Chapter 7. Automatic integration of body built-in sensors into digital design flows -- Chapter 8. Body built-in sensors for testing integrated circuit systems for hardware Trojans.
Abstract: This book provides readers with insight into an alternative approach for enhancing the reliability, security, and low power features of integrated circuit designs, related to transient faults, hardware Trojans, and power consumption. The authors explain how the addition of integrated sensors enables the detection of ionizing particles and how this information can be processed at a high layer. The discussion also includes a variety of applications, such as the detection of hardware Trojans and fault attacks, and how sensors can operate to provide different body bias levels and reduce power costs. Readers can benefit from these sensors-based approaches through designs with fast response time, non-intrusive integration on gate-level and reasonable design costs. Presents a unique approach for detection of radiation-induced transient faults in integrated circuits; Describes the effects of ionizing particles in the transistor body and discusses its exploitation; Includes innovative presentation of the multiple roles of body built-in sensors for reliability, security, and low-power applications.
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Holdings
Item type Current library Collection Call number Status Date due Barcode Item holds
LIBRO-E NO PRÉSTAMO LIBRO-E NO PRÉSTAMO Madrid Digital Acceso Electrónico (UEM) Ciencias e Ingeniería TK7874 2020 EB (Browse shelf(Opens below)) Acceso electrónico eBook06112132
Total holds: 0

Chapter 1. Effects of transient faults in integrated circuits -- Chapter 2. Effectiveness of hardware-level techniques in detecting transient faults -- Chapter 3. Architectures of body built-in current sensors for detection of transient faults -- Chapter 4. Enhancing the design of body built-in sensor architectures -- Chapter 5. Noise robustness of body built-in sensors -- Chapter 6. Body built-in cells for detecting transient faults and adaptively biasing subcircuits -- Chapter 7. Automatic integration of body built-in sensors into digital design flows -- Chapter 8. Body built-in sensors for testing integrated circuit systems for hardware Trojans.

This book provides readers with insight into an alternative approach for enhancing the reliability, security, and low power features of integrated circuit designs, related to transient faults, hardware Trojans, and power consumption. The authors explain how the addition of integrated sensors enables the detection of ionizing particles and how this information can be processed at a high layer. The discussion also includes a variety of applications, such as the detection of hardware Trojans and fault attacks, and how sensors can operate to provide different body bias levels and reduce power costs. Readers can benefit from these sensors-based approaches through designs with fast response time, non-intrusive integration on gate-level and reasonable design costs. Presents a unique approach for detection of radiation-induced transient faults in integrated circuits; Describes the effects of ionizing particles in the transistor body and discusses its exploitation; Includes innovative presentation of the multiple roles of body built-in sensors for reliability, security, and low-power applications.

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