On-Chip Electro-Static Discharge (ESD) Protection for Radio-Frequency Integrated Circuits / by Qiang Cui, Juin J. Liou, Jean-Jacques Hajjar, Javier Salcedo, Yuanzhong Zhou, Parthasarathy Srivatsan.
By: Cui, Qiang, autor
Contributor(s): Liou, Juin J., autor
| Hajjar, Jean-Jacques, autor | Salcedo, Javier, autor | Zhou, Yuanzhong, autor | Srivatsan, Parthasarathy, autor
Material type:
E-bookSeries: (Engineering (Springer-11647)).Publisher: Cham : Springer International Publishing, 2015Description: 1 recurso en línea (XVII, 86 páginas 59 ilustraciones, 42 ilustraciones a color.).ISBN: 9783319108193.Subject: Circuitos integrados
| Item type | Current library | Collection | Call number | Status | Date due | Barcode | Item holds | |
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LIBRO-E NO PRÉSTAMO
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Madrid Digital Acceso Electrónico (UEM) | Ciencias e Ingeniería | TK7874.78 2015 EB (Browse shelf(Opens below)) | Acceso electrónico | eBook.12112872 |
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| TK7874.75 M643 2016 EB IP Cores Design from Specifications to Production : Modeling, Verification, Optimization, and Protection | TK7874.75 P677 2016 EB Microfluidic Very Large Scale Integration (VLSI) : Modeling, Simulation, Testing, Compilation and Physical Synthesis | TK7874.75 S295 2018 EB Contactless VLSI Measurement and Testing Techniques | TK7874.78 2015 EB On-Chip Electro-Static Discharge (ESD) Protection for Radio-Frequency Integrated Circuits | TK7874.78 C446 2016 EB Multiband RF Circuits and Techniques for Wireless Transmitters | TK7874.78 Y836 2016 EB CMOS RF Circuit Design for Reliability and Variability | TK7874.8 2019 EB Nanoelectronics, Circuits and Communication Systems : Proceeding of NCCS 2017 |
Basics in ESD Protection of Radio Frequency Integrated Circuits -- On-Chip Protection Solution for Radio Frequency Integrated Circuits in Standard CMOS Process -- Design of SiGe SCR devices for Radio Frequency Integrated Circuits in SiGe BiCMOS Process -- On-Chip Radio Frequency ESD Protection Solution in GaAs pHEMT Process -- Conclusion.
This book enables readers to design effective ESD protection solutions for all mainstream RF fabrication processes (GaAs pHEMT, SiGe HBT, CMOS). The new techniques introduced by the authors have much higher protection levels and much lower parasitic effects than those of existing ESD protection devices. The authors describe in detail the ESD phenomenon, as well as ESD protection fundamentals, standards, test equipment, and basic design strategies. Readers will benefit from realistic case studies of ESD protection for RFICs and will learn to increase significantly modern RFICs' ESD safety level, while maximizing RF performance. Describes in detail the ESD phenomenon, as well as ESD protection fundamentals, standards, test equipment, and basic design strategies; Enables readers to design effective ESD protection solutions for all mainstream RF fabrication processes (GaAs pHEMT, SiGe HBT, CMOS); Includes realistic case studies of ESD protection for RFICs that resulted in significantly increased ESD safety level, while maximizing RF performance.
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