LabVIEW based Automation Guide for Microwave Measurements / by Satya Kesh Dubey, Naina Narang, P. S. Negi, V. N. Ojha.
By: Dubey, Satya Kesh, autor
Contributor(s): Narang, Naina, autor | Negi, P. S, autor | Ojha, V. N, autor
Material type:
E-bookSeries: (SpringerBriefs in Computational Electromagnetics, 2365-6239); (Engineering (Springer-11647)).Publisher: Singapore : Springer International Publishing, 2018Description: 1 recurso en línea (XIV, 45 páginas 31 ilustraciones a color).ISBN: 9789811062803.Subject: Dispositivos de microondas
Abstract: The book is focused on measurement automation, specifically using the LabView tool. It explains basic measurements in a simplified manner with appropriate step-by-step explanations and discussions of instrument capabilities. It touches upon aspects of measurement science, microwave measurements and software development for measurement. The book can be used as a guide by technicians, researchers and scientists involved in metrology laboratories to automate measurements. The book explains the development process for automation of measurement systems for every step of the software development lifecycle. It covers system design and automation policy creation. The book uses a top-down approach which enables the reader to relate their own problems and develop a system with their own analysis. The book includes many examples, illustrations, flowcharts, measurement results and screenshots of a worked-out automation software for microwave measurement. The book includes discussions on microwave measurements-attenuation, microwave power and E-field strength. The contents of this book will be of interest to students, researchers and scientists working in the field of electromagnetism, antennas, communication and electromagnetic interference/electromagnetic compatibility (EMI/EMC). .
| Item type | Current library | Collection | Call number | Status | Date due | Barcode | Item holds | |
|---|---|---|---|---|---|---|---|---|
LIBRO-E NO PRÉSTAMO
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Madrid Digital Acceso Electrónico (UEM) | Ciencias e Ingeniería | TK7876 2018 EB (Browse shelf(Opens below)) | Acceso electrónico | eBook.15112889 |
Browsing Madrid Digital shelves, Shelving location: Acceso Electrónico (UEM) Close shelf browser (Hides shelf browser)
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The book is focused on measurement automation, specifically using the LabView tool. It explains basic measurements in a simplified manner with appropriate step-by-step explanations and discussions of instrument capabilities. It touches upon aspects of measurement science, microwave measurements and software development for measurement. The book can be used as a guide by technicians, researchers and scientists involved in metrology laboratories to automate measurements. The book explains the development process for automation of measurement systems for every step of the software development lifecycle. It covers system design and automation policy creation. The book uses a top-down approach which enables the reader to relate their own problems and develop a system with their own analysis. The book includes many examples, illustrations, flowcharts, measurement results and screenshots of a worked-out automation software for microwave measurement. The book includes discussions on microwave measurements-attenuation, microwave power and E-field strength. The contents of this book will be of interest to students, researchers and scientists working in the field of electromagnetism, antennas, communication and electromagnetic interference/electromagnetic compatibility (EMI/EMC). .
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