The Boundary-Scan Handbook
Parker, Kenneth P.
The Boundary-Scan Handbook by Kenneth P Parker - 4th ed. - Cham Springer International Publishing 2016 - 1 recurso en línea (XXXIV, 552 páginas) 215 ilustraciones
Boundary-Scan Basics And Vocabulary.-� Boundary-Scan Description Language (BSDL) -- Boundary-Scan Testing -- Advanced Boundary-Scan Topics -- Design for Boundary-Scan Test -- Analog Measurement Basics -- IEEE 1149.4 Analog Boundary-Scan.-� IEEE 1149.6 Testing Advanced I/O.-� IEEE 1532:In-System Configuration -- IEEE 1149.8.1: Passive Components -- IEEE 1149.1:The 2013 Revision.-� IEEE 1149.6: The 2015 Revision.
Aimed at electronics industry professionals, this 4th edition of the Boundary Scan�Handbook describes recent changes to the IEEE1149.1 Standard Test Access Port and�Boundary-Scan Architecture. This updated edition features new chapters on the possible�effects of the changes on the work of the practicing test engineers and the new�1149.8.1 standard. Anyone needing to understand the basics of boundary scan and its�practical industrial implementation will need this book. Provides an overview of the recent changes to the 1149.1 standard and the effect�of the changes on the work of test engineers; � Explains the new IEEE 1149.8.1 subsidiary standard and applications; � Describes the latest updates on the supplementary IEEE testing standards. In particular, addresses: IEEE Std 1149.1 � � � � � � � � � � �Digital Boundary-Scan IEEE Std 1149.4 � � � � � � � � � � �Analog Boundary-Scan IEEE Std 1149.6 � � � � � � � � � ���Advanced I/O Testing IEEE Std 1149.8.1 � � � � � � � � � �Passive Component Testing IEEE Std 1149.1-2013 � � � � � � � � The 2013 Revision of 1149.1 IEEE Std 1532 � � � � � � � � � � � �In-System Configuration IEEE Std 1149.6-2015 � � � � � � � � The 2015 Revision of 1149.6.
9783319011745
Microprocesadores
Semiconductores
TK7868.P7 / P375 2016
The Boundary-Scan Handbook by Kenneth P Parker - 4th ed. - Cham Springer International Publishing 2016 - 1 recurso en línea (XXXIV, 552 páginas) 215 ilustraciones
Boundary-Scan Basics And Vocabulary.-� Boundary-Scan Description Language (BSDL) -- Boundary-Scan Testing -- Advanced Boundary-Scan Topics -- Design for Boundary-Scan Test -- Analog Measurement Basics -- IEEE 1149.4 Analog Boundary-Scan.-� IEEE 1149.6 Testing Advanced I/O.-� IEEE 1532:In-System Configuration -- IEEE 1149.8.1: Passive Components -- IEEE 1149.1:The 2013 Revision.-� IEEE 1149.6: The 2015 Revision.
Aimed at electronics industry professionals, this 4th edition of the Boundary Scan�Handbook describes recent changes to the IEEE1149.1 Standard Test Access Port and�Boundary-Scan Architecture. This updated edition features new chapters on the possible�effects of the changes on the work of the practicing test engineers and the new�1149.8.1 standard. Anyone needing to understand the basics of boundary scan and its�practical industrial implementation will need this book. Provides an overview of the recent changes to the 1149.1 standard and the effect�of the changes on the work of test engineers; � Explains the new IEEE 1149.8.1 subsidiary standard and applications; � Describes the latest updates on the supplementary IEEE testing standards. In particular, addresses: IEEE Std 1149.1 � � � � � � � � � � �Digital Boundary-Scan IEEE Std 1149.4 � � � � � � � � � � �Analog Boundary-Scan IEEE Std 1149.6 � � � � � � � � � ���Advanced I/O Testing IEEE Std 1149.8.1 � � � � � � � � � �Passive Component Testing IEEE Std 1149.1-2013 � � � � � � � � The 2013 Revision of 1149.1 IEEE Std 1532 � � � � � � � � � � � �In-System Configuration IEEE Std 1149.6-2015 � � � � � � � � The 2015 Revision of 1149.6.
9783319011745
Microprocesadores
Semiconductores
TK7868.P7 / P375 2016